Search results for "erbium doping"

showing 2 items of 2 documents

Characterization of optogeometric parameters of optical fibers by near-field scanning probe microscopies

2000

The combination of atomic-force and scanning-near-field optical microscopies is useful for characterizing the physical and optical parameters of optoelectronic devices. With a commercial atomic-force microscope adapted to perform scanning-near-field optical measurements, we succeed in determining core diameters, localizing the erbium doping zone, and analyzing propagation modes in erbium-doped and multimodal optical fibers.

Materials scienceOptical fiberMicroscopebusiness.industryPhysics::OpticsStatistical and Nonlinear PhysicsNear and far fieldChemical vapor depositionErbium dopingAtomic and Molecular Physics and OpticsPtychographylaw.inventionCharacterization (materials science)Core (optical fiber)Condensed Matter::Materials ScienceOpticslawbusinessJournal of the Optical Society of America B
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Influence of specific codopants and post-treatments on Erbium Doped Fibers: Radiation behavior characteristics by CML

2010

optical fibererbium dopingirradiation effects
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